Journal of Systems Engineering and Electronics ›› 2009, Vol. 31 ›› Issue (9): 2276-2279.

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Study on BIT optimization design of airborne electronic equipment

MA Cun-bao1, WANG Yan-wen1, SHI Hao-shan2, ZHANG Wei1   

  1. 1. School of Aeronautics, Northwestern Polytechnical Univ., Xi’an 710072, China;
    2. School of Electronics and Information, Northwestern Polytechnical Univ., Xi’an 710072, China
  • Received:2008-07-23 Revised:2008-11-05 Online:2009-09-20 Published:2010-01-03

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Abstract: Built-in test(BIT) can improve the mission reliability of the system and enhance the mission effectiveness of equipment systems.The impact of BIT on the system is analyzed according to the BIT optimization design concept based on the reliability,the BIT optimization design methods based on reliability are mainly discussed,the non-linear integer programming(NLIP) model of the BIT optimization design is presented,and the model is calculated by LINGO.The results indicate that the system fault probability is decreased,and the performances of the BIT design are increased effectively by the proposed approach.

CLC Number: 

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