基于有限元分析的弹载二次电源高加速寿命试验仿真模拟

doi:10.12305/j.issn.1001-506X.2021.04.34

摘要/Abstract

摘要：

针对高加速寿命试验(high accelerated life test, HALT)开展难度大、设备要求高的特点, 为获取某型导弹弹载电子设备温度工作极限, 基于有限元理论在开展温度场分布和等效应力分析的良好效果, 选取某型导弹导引头二次电源为研究对象, 开展HALT仿真试验。首先, 开展二次电源组件有限元分析, 建立三维模型, 定义材料参数, 进行网格划分, 设定边界条件。然后, 按照二次电源组件HALT方案设计要求和温度分析理论, 基于ANSYS软件开展组件的HALT仿真试验, 得到组件在高、低温步进应力载荷下的温度梯度分布和等效应力分布。最后通过分析试验结果, 确定二次电源组件高、低温工作极限范围。仿真试验表明, 二次电源组件在高温135 ℃会因为焊点脱落发生失效, 这为通过HALT仿真试验获取产品可靠性信息提供了新思路。

关键词: 加速老化试验, 高加速寿命试验, 有限元, 步进应力, 焊点

Abstract:

The high accelerated life test (HALT) is difficult to carry out and it has high requirements for equipment. To obtain a certain type of missile onboard electronic equipment operating temperature limit, based on the finite element theory in the temperature field distribution and the good results of equivalent stress analysis, a certain type of missile seeker secondary power supply is Selected as the research object, and simulation of the HALT is carried out. First, according to the three-dimensional model established by the component finite element analysis, the material parameters are defined, the mesh is divided, and the boundary conditions are set. Then, according to the design requirements of the second power supply component HALT scheme and the temperature analysis theory, the simulation test of the component HALT is carried out based on ANSYS software, and the temperature gradient distribution and equivalent stress distribution of the component under high and low temperature stepping stress loads are obtained. Finally, by analyzing the experimental results, the high and low temperature operating limits of the secondary power supply components are obtained. The simulation experiment shows that the secondary power supply component will fail due to the solder joint falling off at 135 ℃, which provides a new idea for obtaining the product reliability information through the HALT simulation experiment.

Key words: accelerated aging test, high accelerated life test, finite element, step stress, solder joint

中图分类号:

TG156
V240.2

张鑫, 韩建立, 李永强, 王瑶. 基于有限元分析的弹载二次电源高加速寿命试验仿真模拟[J]. 系统工程与电子技术, 2021, 43(4): 1153-1160.

Xin ZHANG, Jianli HAN, Yongqiang LI, Yao WANG. High accelerated life test simulation of secondary power supply on missile based on finite element analysis[J]. Systems Engineering and Electronics, 2021, 43(4): 1153-1160.

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器件	材料	密度/(kg/m³)	泊松比/(N·A^-1)	热膨胀系数/℃	弹性模量/MPa	比热容/(J·kg^-1·℃)	导热率/(W·m^-1·℃)	热功耗/mW
二极管	主体为SiO₂	1570	0.25	13 E-6	2.1E+10	500	1	45
PCB	FRT4	1413.5	0.28	15E-6	1.1E+10	650	1	0
电阻	氧化铝陶瓷	2 300	0.32	6.7E-6	7.65E+10	350	0.70	70
管脚	镀镍铜线	8 846.3	0.31	16.6-6	1.17E+11	390	3.85	0
焊点	Sn63Pb37	8 400	0.40	24.5E-6	3.05E+10	280	10	0
芯片组件	主体为BT	1 770	0.30	13 E-6	2.1E+10	500	1	20

量级/℃(低温)	焊点应力MPa	量级/℃(高温)	焊点应力MPa
0	11.6	35	4.7
-10	16.3	45	9.4
-15	18.8	55	14.1
-20	21	65	17.8
-25	23.5	75	23.5
-30	25.7	80	25.7
-35	28.2	85	28.2
-40	30.6	90	30.6
-45	32.6	95	32.6
-50	35.4	100	35.4
-55	37.3	105	37.3
—	—	110	40.1
—	—	115	41.9
—	—	120	44.8
—	—	125	46.6
—	—	130	49.5
—	—	135	51.2
—	—	140	54.2
—	—	145	55.9
—	—	150	58.9
—	—	155	60.6

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